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Fault spectrum: an analysis of system level test with proposed solutions = : Eine Untersuchung ueber das erwartete Fehlerspektrum in Systemtests

This paper is the culmination of a study that spans eleven separate companies in seven different industries, indicating the fault types occuring at system test, the magnitude of the faults, and why they were not detected at board test. The significant undetected fault types are split into three cate... Full description

Contained in: int. test conf. (1981), p. 497-500
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Additional Keywords: ELEKTRONISCHES-BAUELEMENT
FEHLERANALYSE
FEHLERHAEUFIGKEIT
FEHLERQUELLE
FERTIGUNGSKONTROLLE
MATERIALPRUEFUNG
PRUEFEINRICHTUNG
PRUEFPROGRAMM
PRUEFUNG
PRUEFVERFAHREN
QUALITAETSKONTROLLE
SYSTEMTECHNIK
SYSTEMZUVERLAESSIGKEIT
THEORETISCHES-MODELL
Notes: Copyright: Metadaten: TEMA, Copyright WTI-Frankfurt eG
Copyright: (C) Alle Rechte beim Herausgeber
Physical Description: 4 Seiten, 4 Bilder
PPN (Catalogue-ID): WTI015457249
Note: WTI TEMA DB
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Internes Format
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028 5 2 |a TEMA1982_wti_pica 
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084 |a 3I  |a 3F  |2 FON2006 
245 0 0 |a Fault spectrum: an analysis of system level test with proposed solutions =  |b Eine Untersuchung ueber das erwartete Fehlerspektrum in Systemtests 
300 |a 4 Seiten, 4 Bilder 
500 |a Copyright: Metadaten: TEMA, Copyright WTI-Frankfurt eG 
500 |a Copyright: (C) Alle Rechte beim Herausgeber 
520 |a This paper is the culmination of a study that spans eleven separate companies in seven different industries, indicating the fault types occuring at system test, the magnitude of the faults, and why they were not detected at board test. The significant undetected fault types are split into three categories: defective electronic components, assembly errors, and defective source materials (i.e., sliver shorts and open lands). The defective electronic component is the largest fault contributor. 
653 4 |a PRUEFUNG 
653 4 |a SYSTEMZUVERLAESSIGKEIT 
653 4 |a THEORETISCHES-MODELL 
653 4 |a SYSTEMTECHNIK 
653 4 |a PRUEFPROGRAMM 
653 4 |a PRUEFVERFAHREN 
653 4 |a PRUEFEINRICHTUNG 
653 4 |a FEHLERHAEUFIGKEIT 
653 4 |a FEHLERQUELLE 
653 4 |a FEHLERANALYSE 
653 4 |a ELEKTRONISCHES-BAUELEMENT 
653 4 |a MATERIALPRUEFUNG 
653 4 |a QUALITAETSKONTROLLE 
653 4 |a FERTIGUNGSKONTROLLE 
773 0 8 |i In  |t int. test conf.  |g (1981), p. 497-500  |q <497-500 
912 |a GBV_WTI 
950 |a PRUEFUNG  |a SYSTEMZUVERLAESSIGKEIT  |a THEORETISCHES MODELL  |a SYSTEMTECHNIK  |a PRUEFPROGRAMM  |a PRUEFVERFAHREN  |a PRUEFEINRICHTUNG  |a FEHLERHAEUFIGKEIT  |a FEHLERQUELLE  |a FEHLERANALYSE  |a ELEKTRONISCHES BAUELEMENT  |a WERKSTOFFPRUEFUNG  |a QUALITAETSPRUEFUNG  |a FERTIGUNGSKONTROLLE  |2 DE-601 
951 |a AR 
952 |j 1981  |h 497-500