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Thickness dependence of microcrack formation in YBa2Cu3O6+ x thin films on NdGaO3 (001) substrates

Contributors: Palonen, H.
Huhtinen, H.
Paturi, P.
Contained in: Thin solid films : international journal on the science and technology of condensed matter films Amsterdam [u.a.] Elsevier Vol. 519, No. 22 (2011), p. 8058-8063
Journal Title: Thin solid films : international journal on the science and technology of condensed matter films
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ISSN: 0040-6090
Regional Holdings: TIB – German National Library of Science and Technology
ID (e.g. DOI, URN): 00428744
PPN (Catalogue-ID): OLC1879087537
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Internes Format
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